Reflecting antiferromagnetic arrangements
Date: December 5, 2018 Source: DOE/Brookhaven National Laboratory Summary: An X-ray imaging technique could help scientists understand -- and ultimately control -- the magnetic structure of promising materials for the development of electronic devices that exploit electron spin. A team led by Rutgers University and including scientists from the U.S. Department of Energy's (DOE) Brookhaven National Laboratory has demonstrated an x-ray imaging technique that could enable the development of smaller, faster, and more robust electronics. Described in a paper published on Nov. 27 in Nature Communications , the technique addresses a primary limitation in the emerging research field of "spintronics," or spin electronics, using magnetic materials known as antiferromagnets (AFMs): the ability to image antiphase magnetic domains. Electrons in magnetic atoms point, or "spin," in an up or down direction. In all magnetic materials, there are distinct regions -- ma...